A primary feature of Acroname hubs is the ability to turn a USB port on and off. Looking more closely, Acroname hubs also have the more granular ability to disable power/VBUS on a given port, independently from the USB D+/D- data lines on the same port.
The next-generation circuitry in today’s consumer and industrial electronics is smaller, faster, better. Consumers love the innovations. But test engineers are not as enthusiastic. Because that innovation comes with a striking downside: increased susceptibility to electrostatic discharge.
If the USB devices you’re using aren’t built for rugged environments, a catastrophic failure could — and probably will — happen. You’ll have to tell the C-Suite that all your electronic components fried because your ESD mitigations failed.
When it comes to advanced and cost sensitive electronic products, it remains vital to accurately test these devices during manufacturing and assembly to make sure they provide what the consumer expects and that each and every feature works how it should, right out of the box. The last thing a company needs is for faulty product to reach the hands of hard-won customers. Having disappointed consumers and managing recall related expenses are important problems to be avoided. But at what cost?
The BrainStem scratchpad is a shared memory on a brainstem module which is accessible from both the host and Reflex code. It serves as a simple interprocess communication channel for separate Reflex routines, as well as a communication channel between the host and reflex code running on the BrainStem module.
Today's mobile devices continue to integrate more features and functions into ever smaller packages. Features usually win over battery life during the design phase. In order to help quantify and develop test methods, Acroname was contracted by a major cellphone manufacturer to design a mobile diagnostic system for cellphones.